• NDT / Materials Testing
    Learn More About How Infrared Helps Inspect Solar Cells
 

Non-Destructive Testing (NDT) / Materials Testing

FLIR cameras with Lock-In, Transient, and Pulse capability possess the ability to perform advanced inspections such as Non-Destructive Testing (NDT) or stress mapping that resolves temperature differences as low as 1 mK. NDT is a widely used method to evaluate the properties of a material, component or, system without causing damage. Thermal imaging cameras can detect internal defects through target excitation and the observation of thermal differences on a target's surface. It is a valuable tool for detecting defects and points of failure in composites, solar cells, bridges, and electronics. It is also a great tool for thermal mapping of stress when performing materials testing.

Hyperspectral Imaging

Hyperspectral imaging systems collect both spectral and spatial information in one instantaneous video frame. FLIR has teamed up with industry leaders to provide hyperspectral imaging solutions that help you learn more from your photons.

Stress Analysis

Stress and fatigue testing are common test methods in mechanical engineering and materials science, but provide limited information on complex structures.

Composite Inspection

Thermal non-destructive testing can detect internal defects through target excitation and the observation of thermal differences on a target surface.

Solar Cell Inspection

Solar cells may have electrical shunt defects. When the cell is energized, these shunts can be detected easily with Lock-In thermography.

Crack Detection

Lock-in thermographic inspection of critical parts for cracks is done by synchronizing the camera image capture with the frequency of energy going into a part.

Bridge Inspection

Bridge Deck Inspection is a Non destructive multi sensor technique that identifies areas of deterioration and calculates a quantitative index to determine the degree of deterioration for each span/lane of the bridge.

Electronics Failure Analysis

Failure Analysis (FA) testing on electronics is a common technique that utilizes a FLIR thermal camera to visualize and identify anomalies on small Integrated Circuits and PCB’s down to 3.5um spot sizes.

A-Series Cameras

FLIR A325sc IR Camera

FLIR A325sc LWIR Cameras

Designed from the ground up to deliver the accurate thermographic imaging and repeatable temperature measurements you need in your R&D applications.

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FLIR A655sc IR Camera

FLIR A655sc LWIR Cameras

An Uncooled detector, high resolution, and all of the cutting-edge functionality the A655sc brings affordable research and science thermal imaging and measurement to a whole new level.

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FLIR A6750sc LWIR and MWIR Cameras

FLIR A6750sc LWIR & MWIR Cameras

Designed for electronics inspections, medical thermography, manufacturing monitoring, and non-destructive testing, the camera is ideal for high-speed thermal events and fast-moving targets.

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Fixed Advanced Level Cameras

FLIR SC6000 Series MWIR Camera

FLIR SC6000 Series MWIR Cameras

The versatile FLIR SC6000 Series cameras give you high speed and high resolution imagery in a package that’s easy to use yet flexible in configurations for just about any scientific or research application.

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FLIR SC7000 Series IR Camera

FLIR SC7000 Series LWIR Cameras

Specifically designed for academic and industrial research and science applications as well as integrators who require a flexible camera with high sensitivity, accuracy, spatial resolution, and speed at an affordable cost.

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FLIR SC8000 HD Series IR Camera

FLIR SC8000 Series MWIR Cameras

High definition MWIR imagery from a highly sensitive cooled InSb detector, the sc8000 Series provides superb resolution, and lightning fast frame and data rates for extreme imaging flexibility and data capture capability.

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FLIR X8000sc/X6000sc Series Thermal Imaging Cameras

FLIR X8000sc/X6000sc Series

The FLIR X8000sc/X6000sc Series thermal imaging cameras are designed to provide the best thermal measurement performance together with the most advanced connectivity. Ideal for Scientists and R&D professionals.

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